Test and diagnosis for small-delay defects /

Bibliographic Details
Main Author:	Tehranipoor, Mohammad H., 1974-
Corporate Author:	SpringerLink (Online service)
Other Authors:	Chakrabarty, Krishnendu, Pang, Ke
Format:	eBook
Language:	English
Published:	New York : Springer, [2011]
Subjects:	Integrated circuits > Fault tolerance. Integrated circuits > Testing. Electronic books.
Online Access:	Connect to the full text of this electronic book

Available Online