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Bibliographic Details
Corporate Authors: IEEE Radiation Effects Data Workshop, IEEE Nuclear and Plasma Sciences Society, IEEE Nuclear and Space Radiation Effects Conference
Format: Conference Proceeding
Language:English
Published: Piscataway, NJ : IEEE.
Subjects:
Electronic apparatus and appliances > Effect of radiation on > Congresses.
Integrated circuits > Effect of radiation on > Congresses.
Metal oxide semiconductors, Complementary > Effect of radiation on > Congresses.
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Conference Proceeding
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