Cover Image

Workshop record /

Show other versions (1)
Bibliographic Details
Corporate Authors: IEEE Radiation Effects Data Workshop, IEEE Nuclear and Plasma Sciences Society, IEEE Nuclear and Space Radiation Effects Conference
Format: Conference Proceeding
Language:English
Published: Piscataway, NJ : IEEE.
Subjects:
Electronic apparatus and appliances > Effect of radiation on > Congresses.
Integrated circuits > Effect of radiation on > Congresses.
Metal oxide semiconductors, Complementary > Effect of radiation on > Congresses.
Online Availability: Check for online availability

Available Online

Holdings details from Available Online
Call Number: TK7869 .I334 Electronic
 
Call Number Status Get It
TK7869 .I334 Electronic Available