Cover Image

Reliability wearout mechanisms in advanced CMOS technologies /

Bibliographic Details
Other Authors: Strong, Alvin Wayne, 1946-
Format: eBook
Language:English
Published: Piscataway, NJ : Hoboken, NJ : IEEE Press ; Wiley, [2009]
Series:IEEE Press series on microelectronic systems.
Wiley Online Library.
Subjects:
Metal oxide semiconductors, Complementary > Reliability.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (xv, 624 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:047045525X (electronic bk.)
0470455268
9780470455258 (electronic bk.)
9780470455265
DOI:10.1002/9780470455265