Reliability wearout mechanisms in advanced CMOS technologies /

Bibliographic Details
Other Authors:	Strong, Alvin Wayne, 1946-
Format:	eBook
Language:	English
Published:	Piscataway, NJ : Hoboken, NJ : IEEE Press ; Wiley, [2009]
Series:	IEEE Press series on microelectronic systems. Wiley Online Library.
Subjects:	Metal oxide semiconductors, Complementary > Reliability. TECHNOLOGY & ENGINEERING > Electronics > Digital. TECHNOLOGY & ENGINEERING > Electronics > Microelectronics. Electronic books.
Online Access:	Connect to the full text of this electronic book

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