APA (7th ed.) Citation

Strong, A. W. (2009). Reliability wearout mechanisms in advanced CMOS technologies. IEEE Press ; Wiley. https://doi.org/10.1002/9780470455265

Chicago Style (17th ed.) Citation

Strong, Alvin Wayne. Reliability Wearout Mechanisms in Advanced CMOS Technologies. Piscataway, NJ : Hoboken, NJ: IEEE Press ; Wiley, 2009. https://doi.org/10.1002/9780470455265.

MLA (9th ed.) Citation

Strong, Alvin Wayne. Reliability Wearout Mechanisms in Advanced CMOS Technologies. IEEE Press ; Wiley, 2009. https://doi.org/10.1002/9780470455265.