Conformance test architecture for biometric data interchange formats : version beta 2.0 /

Bibliographic Details
Main Author:	Podio, Fernando L.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Yaga, Dylan, Jerde, Mark
Format:	Government Document eBook
Language:	English
Published:	[Gaithersburg, Md.] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2011]
Series:	NISTIR ; 7771.
Subjects:	Biometric identification > Computer programs > Standards. Biometric identification > Data processing. Internetworking (Telecommunication) > Standards.
Online Access:	https://purl.fdlp.gov/GPO/gpo8856

Available Online