Lightning pin injection test : MOSFETS in "ON" state /

Bibliographic Details

Corporate Author:	Langley Research Center
Other Authors:	Ely, Jay J.
Format:	Government Document eBook
Language:	English
Published:	Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2011]
Series:	NASA technical memorandum ; 217047.
Subjects:	X ray inspection. Damage assessment. Lightning. Metal oxide semiconductors. Optical microscopes. Waveforms.
Online Access:	https://purl.fdlp.gov/GPO/gpo8845