Soft errors in modern electronic systems /

Bibliographic Details
Corporate Author:	SpringerLink (Online service)
Other Authors:	Nicolaidis, Michael
Format:	eBook
Language:	English
Published:	New York : Springer Science+Business Media, LLC, [2011]
Series:	Frontiers in electronic testing ; v. 41.
Subjects:	Electronic apparatus and appliances > Effect of radiation on. Integrated circuits > Very large scale integration. Electronic books.
Online Access:	Connect to the full text of this electronic book

Available Online