Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29-December 3, 2009, Boston, Massachustts, U.S.A. /

Bibliographic Details
Corporate Author:	Materials Research Society. Fall Meeting Symposium B.
Other Authors:	Ueda, Osamu
Format:	Book
Language:	English
Published:	Warrendale, Pa. : Materials Research Society, [2010]
Series:	Materials Research Society symposia proceedings ; v. 1195.
Subjects:	Materials > Reliability > Congresses. Semiconductors > Materials > Congresses. Microelectronics > Reliability > Congresses.

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