Error analysis and calibration uncertainty of capacitance standards at NIST /

Bibliographic Details
Main Author: Chang, Y. May
Corporate Author: National Institute of Standards and Technology (U.S.)
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
Series:NIST special publication ; 250-52.
NIST special publication. NIST measurement services.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/gpo5327

Internet

https://purl.fdlp.gov/GPO/gpo5327

Available Online

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Call Number: C 13.10:250-52
 
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C 13.10:250-52 Available