Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies /
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| Format: | eBook |
| Language: | English |
| Published: |
New York :
Springer,
[2010]
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| Online Access: | Connect to the full text of this electronic book |
| Item Description: | Electronic resource. |
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| Physical Description: | xv, 171 pages : illustrations ; 24 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 1441909389 9781441909381 |
| DOI: | 10.1007/978-1-4419-0938-1 |