Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies /

Bibliographic Details
Corporate Author:	SpringerLink (Online service)
Other Authors:	Bosio, Alberto
Format:	eBook
Language:	English
Published:	New York : Springer, [2010]
Subjects:	Random access memory > Testing. Electronic books.
Online Access:	Connect to the full text of this electronic book

Available Online