Nanometer technology designs : high-quality delay tests /

Bibliographic Details
Main Author:	Tehranipoor, Mohammad H., 1974-
Other Authors:	Ahmed, Nisar
Format:	eBook
Language:	English
Published:	New York, NY : Springer, [2008]
Subjects:	Integrated circuits > Testing. Integrated circuits > Very large scale integration. Nanotechnology. Electronic books.
Online Access:	Connect to the full text of this electronic book

Description
Item Description:	Description based on print version record. Electronic resource.
Physical Description:	1 online resource (xvii, 281 pages) : illustrations
Bibliography:	Includes bibliographical references and index.
ISBN:	0387757287 9780387757285
DOI:	10.1007/978-0-387-75728-5