Nanometer technology designs : high-quality delay tests /

Bibliographic Details
Main Author:	Tehranipoor, Mohammad H., 1974-
Other Authors:	Ahmed, Nisar
Format:	eBook
Language:	English
Published:	New York, NY : Springer, [2008]
Subjects:	Integrated circuits > Testing. Integrated circuits > Very large scale integration. Nanotechnology. Electronic books.
Online Access:	Connect to the full text of this electronic book

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