Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials /

Bibliographic Details
Main Author:	Sarney, Wendy L.
Corporate Author:	U.S. Army Research Laboratory
Format:	Government Document eBook
Language:	English
Published:	Adelphi, MD : Army Research Laboratory, [2003]
Series:	ARL-TR (Aberdeen Proving Ground, Md.) ; 3128.
Subjects:	Diffraction patterns > Analysis. Semiconductors > Materials > Structure > Analysis. Transmission electron microscopes.
Online Access:	https://purl.fdlp.gov/GPO/gpo1550

Available Online