Cover Image

Electromigration on semiconductor integrated circuits.

Bibliographic Details
Corporate Author: U.S. Nuclear Regulatory Commission. Office of Nuclear Reactor Regulation
Format: Government Document eBook
Language:English
Published: Washington, DC : U.S. Nuclear Regulatory Commission, Office of Nuclear Reactror Regulation, [2002]
Series:NRC information notice ; 2002-32.
Subjects:
Integrated circuits.
Semiconductors.
Electrodiffusion.
Online Access:https://purl.fdlp.gov/GPO/LPS126441
Description
Item Description:Title from PDF title screen (viewed on Sept. 29, 2010).
"October 31, 2002."
"ML023080088."
Electronic resource.
Physical Description:1 online resource (2 pages).