Electromigration on semiconductor integrated circuits.

Bibliographic Details

Corporate Author:	U.S. Nuclear Regulatory Commission. Office of Nuclear Reactor Regulation
Format:	Government Document eBook
Language:	English
Published:	Washington, DC : U.S. Nuclear Regulatory Commission, Office of Nuclear Reactror Regulation, [2002]
Series:	NRC information notice ; 2002-32.
Subjects:	Integrated circuits. Semiconductors. Electrodiffusion.
Online Access:	https://purl.fdlp.gov/GPO/LPS126441