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Reliability and radiation effects in compound semiconductors /

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Bibliographic Details
Main Author: Johnston, Allan (Allan H.)
Format: Book
Language:English
Published: Singapore ; Hackensack, N.J. : World Scientific Publishing Company, [2010]
Subjects:
Compound semiconductors > Reliability.
Compound semiconductors > Effect of radiation on.

Evans: Library Stacks

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Call Number: TK7871.99.C65 J64 2010
 
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TK7871.99.C65 J64 2010 Available