Manhattan picture worlds : Thomas Wrede /

Bibliographic Details
Main Author:	Wrede, Thomas, 1963-
Corporate Author:	Beck & Eggeling
Other Authors:	Schaden, Christoph, 1967-, Berman, Marshall, 1940-2013
Format:	Book
Language:	German English
Language Notes:	Texts in German and English.
Published:	Bielefeld : Kerber, 2009.
Series:	Kerber photoart.
Subjects:	Wrede, Thomas, > 1963- > Exhibitions.

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