Fundamental principles of engineering nanometrology /

The principles of engineering metrology applied to the micro- and nanoscale: essential reading for all scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale. The establishment of common standards will be an essentia...

Full description

Bibliographic Details
Main Author: Leach, R. K.
Corporate Author: ScienceDirect (Online service)
Format: eBook
Language:English
Published: Oxford : Amsterdam : William Andrew ; Elsevier Science, [2010]
Edition:1st ed.
Series:Micro & nano technologies.
Subjects:
Online Access:Connect to the full text of this electronic book
Search Result 1
Search Result 2