Cover Image

X-ray optics and microanalysis : proceedings of the 20th International Congress : Karlsruhe, Germany, 15-18 September 2009 /

Bibliographic Details
Other Authors: Denecke, Melissa A., Walker, Clive T.
Format: Book
Language:English
Published: Melville, N.Y. : American Institute of Physics, 2010.
Series:AIP conference proceedings ; no. 1221.
Subjects:
Materials > Microscopy > Congresses.
X-ray microanalysis > Congresses.
X-ray microscopes > Congresses.
Description
Item Description:"All papers have been peer reviewed."
"ICXCM20 Proceedings"--P. ix.
"20th International Congress on X-ray optics and microanalysis"--P. 203.
Physical Description:xiv, 216 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0735407649
9780735407640
ISSN:0094-243X ;