X-ray optics and microanalysis : proceedings of the 20th International Congress : Karlsruhe, Germany, 15-18 September 2009 /
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Melville, N.Y. :
American Institute of Physics,
2010.
|
| Series: | AIP conference proceedings ;
no. 1221. |
| Subjects: |
Remote Storage
| Call Number: |
TA417.23 .X17 2009 |
|
|---|---|---|
| Call Number | Status | Get It |
| TA417.23 .X17 2009 | Available | |