Design methodologies for built-in testing of integrated RF transceivers with the on-chip loopback technique /

Bibliographic Details

Main Author:	Onabajo, Marvin Olufemi
Other Authors:	Silva-Martinez, Jose (Thesis advisor)
Format:	Thesis eBook
Language:	English
Published:	[College Station, Tex.] : [Texas A&M University], [2010]
Subjects:	Major electrical engineering. Built-in test (BIT) RF front-end testing RF current injection offset mixer integrated transceiver low-noise amplifier (LNA) loopback
Online Access:	Link to OAK Trust copy