Stochastic reliability modeling, optimization and applications /

Bibliographic Details
Other Authors: Nakamura, Syouji, Nakagawa, Toshio, 1942-
Format: Book
Language:English
Published: Singapore ; Hackensack, NJ : World Scientific, [2010]
Subjects:

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TA169 .S77 2010
 
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TA169 .S77 2010 Available