Mismatch and noise in modern IC processes /
Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. "Mismatch and Noise in Modern IC Processes" examines these related effects and how they affect the building block circuits of modern integrated circuits, fro...
| Main Author: | |
|---|---|
| Format: | eBook |
| Language: | English |
| Published: |
[San Rafael, Calif.] :
Morgan & Claypool,
[2009]
|
| Series: | Synthesis lectures on digital circuits and systems (Online) ;
#19. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Search Result 1
