Mismatch and noise in modern IC processes /

Component variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. "Mismatch and Noise in Modern IC Processes" examines these related effects and how they affect the building block circuits of modern integrated circuits, fro...

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Bibliographic Details
Main Author: Marshall, Andrew, 1958-
Format: eBook
Language:English
Published: [San Rafael, Calif.] : Morgan & Claypool, [2009]
Series:Synthesis lectures on digital circuits and systems (Online) ; #19.
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Call Number: TK7874 .M275 2009
 
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TK7874 .M275 2009 Available