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Computed tomography : principles, design, artifacts, and recent advances /

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Bibliographic Details
Main Author: Hsieh, Jiang
Corporate Author: SPIE (Society)
Format: Book
Language:English
Published: Bellingham, Wash. : Hoboken, N.J. : SPIE ; J. Wiley & Sons, [2009]
Edition:2nd ed.
Subjects:
Tomography.
Tomography, X-Ray Computed.
Tomography Scanners, X-Ray Computed > trends.
Tomography, X-Ray Computed > instrumentation.
Tomography, X-Ray Computed > trends.
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by Hsieh, Jiang
Published 2022
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by Hsieh, Jiang
Published 2015
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Search Result 5
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by Hsieh, Jiang
Published 2003
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