Cover Image

Computed tomography : principles, design, artifacts, and recent advances /

Show other versions (5)
Bibliographic Details
Main Author: Hsieh, Jiang
Corporate Author: SPIE (Society)
Format: Book
Language:English
Published: Bellingham, Wash. : Hoboken, N.J. : SPIE ; J. Wiley & Sons, [2009]
Edition:2nd ed.
Subjects:
Tomography.
Tomography, X-Ray Computed.
Tomography Scanners, X-Ray Computed > trends.
Tomography, X-Ray Computed > instrumentation.
Tomography, X-Ray Computed > trends.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: RC78.7.T6 H757 2009
 
Call Number Status Get It
RC78.7.T6 H757 2009 Available