Computed tomography : principles, design, artifacts, and recent advances /

Bibliographic Details
Main Author: Hsieh, Jiang
Corporate Author: SPIE (Society)
Format: Book
Language:English
Published: Bellingham, Wash. : Hoboken, N.J. : SPIE ; J. Wiley & Sons, [2009]
Edition:2nd ed.
Subjects:

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