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Computed tomography : principles, design, artifacts, and recent advances /

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Bibliographic Details
Main Author: Hsieh, Jiang
Corporate Author: SPIE (Society)
Format: Book
Language:English
Published: Bellingham, Wash. : Hoboken, N.J. : SPIE ; J. Wiley & Sons, [2009]
Edition:2nd ed.
Subjects:
Tomography.
Tomography, X-Ray Computed.
Tomography Scanners, X-Ray Computed > trends.
Tomography, X-Ray Computed > instrumentation.
Tomography, X-Ray Computed > trends.
Description
Physical Description:xiv, 556 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9780470563533
0470563532
9780819475336
0819475335