Reliability wearout mechanisms in advanced CMOS technologies /

Bibliographic Details
Corporate Author:	Strong, Alvin Wayne
Format:	Book
Language:	English
Published:	Piscataway, NJ : Hoboken, NJ : IEEE Press ; Wiley, [2009]
Series:	IEEE Press series on microelectronic systems.
Subjects:	Metal oxide semiconductors, Complementary > Reliability.

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