ESD : failure mechanisms and models /

Bibliographic Details
Main Author:	Voldman, Steven H.
Format:	Book
Language:	English
Published:	Chichester, West Sussex, U.K. ; Hoboken, N.J. : J. Wiley, 2009.
Subjects:	Semiconductors > Failures. Integrated circuits > Protection. Integrated circuits > Testing. Integrated circuits > Reliability. Electric discharges. Electrostatics.

Evans: Library Stacks