Defects in microelectronic materials and devices /

Bibliographic Details
Other Authors:	Fleetwood, D. M. (Dan M.), Pantelides, Sokrates T., Schrimpf, Ronald Donald
Format:	Book
Language:	English
Published:	Boca Raton : CRC Press, [2009]
Subjects:	Microelectronics > Materials > Testing. Metal oxide semiconductor field-effect transistors > Testing. Integrated circuits > Defects.
Online Access:	Table of contents only

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