Characterization of oxide/semiconductor interfaces for CMOS technologies : April 9-13, 2007, San Francisco, California, USA.

Bibliographic Details
Corporate Author:	Materials Research Society. Fall Meeting
Format:	Book
Language:	English
Published:	Warrendale, Pa. : Materials Research Society, [2007]
Series:	Materials Research Society symposia proceedings ; v. 996.
Subjects:	Metal oxide semiconductors, Complementary > Congresses. Metal oxide semiconductors > Materials > Congresses. Thin films > Materials > Congresses. Semiconductors > Junctions > Congresses.

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