Synthesis and metrology of nanoscale oxides and thin films : March 24-28, 2008, San Francisco, California, USA.

Bibliographic Details
Corporate Author: Materials Research Society. Fall Meeting
Format: Book
Language:English
Published: Warrendale, PA : Materials Research Society, [2008]
Series:Materials Research Society symposia proceedings ; v. 1074.
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: TA418.9.N35 S967 2008
 
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TA418.9.N35 S967 2008 Available