Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces /

Bibliographic Details
Main Author: Kaupp, G. (Gerd)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin : Springer-Verlag, 2006.
Series:Nanoscience and technology.
Subjects:
Online Access:Connect to the full text of this electronic book
Publisher description
Description
Item Description:Electronic resource.
Physical Description:xii, 292 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:3540284729
9783540284727
ISSN:1434-4904
DOI:10.1007/978-3-540-28472-7