Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces /

Bibliographic Details

Main Author:	Kaupp, G. (Gerd)
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Berlin : Springer-Verlag, 2006.
Series:	Nanoscience and technology.
Subjects:	Atomic force microscopy. Near-field microscopy. Microscopie à champ proche. Microscopie à force atomique. Electronic books.
Online Access:	Connect to the full text of this electronic book Publisher description