CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test /
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| Corporate Author: | |
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| Format: | eBook |
| Language: | English |
| Published: |
[Dordrecht] :
Springer,
[2008]
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| Series: | Frontiers in electronic testing ;
40. |
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| Online Access: | Connect to the full text of this electronic book |
| Item Description: | Electronic resource. |
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| Physical Description: | xvi, 193 pages : illustrations ; 25 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 1402083637 9781402083631 |
| DOI: | 10.1007/978-1-4020-8363-1 |