CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test /
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| Format: | eBook |
| Language: | English |
| Published: |
[Dordrecht] :
Springer,
[2008]
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| Series: | Frontiers in electronic testing ;
40. |
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| Online Access: | Connect to the full text of this electronic book |
Internet
Connect to the full text of this electronic bookAvailable Online
| Call Number: |
TK7871.99.M44 P38 2008eb |
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| Call Number | Status | Get It |
| TK7871.99.M44 P38 2008eb | Available | |