Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

Bibliographic Details
Main Author: Egerton, R. F.
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York : Springer Science+Business Media, [2005]
Subjects:
Online Access:Connect to the full text of this electronic book
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by Egerton, R. F.
Published 2005
Book