Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

Bibliographic Details

Main Author:	Egerton, R. F.
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	New York : Springer Science+Business Media, [2005]
Subjects:	Microscopy, Electron. Physics. Electron microscopy. Microscopie électronique. Electronic books.
Online Access:	Connect to the full text of this electronic book