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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

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Bibliographic Details
Main Author: Egerton, R. F.
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York : Springer Science+Business Media, [2005]
Subjects:
Microscopy, Electron.
Physics.
Electron microscopy.
Microscopie électronique.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:xii, 202 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages [195]-196) and index.
ISBN:0387260161
9780387260167
DOI:10.1007/b136495