Emerging nanotechnologies : test, defect tolerance, and reliability /
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| Other Authors: | |
| Format: | eBook |
| Language: | English |
| Published: |
New York :
Springer Verlag,
[2008]
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| Series: | Frontiers in electronic testing ;
37. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Item Description: | Electronic resource. |
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| Physical Description: | xii, 405 pages : illustrations ; 24 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0387747478 9780387747477 |
| DOI: | 10.1007/978-0-387-74747-7 |