Emerging nanotechnologies : test, defect tolerance, and reliability /

Bibliographic Details

Corporate Author:	SpringerLink (Online service)
Other Authors:	Tehranipoor, Mohammad H., 1974-
Format:	eBook
Language:	English
Published:	New York : Springer Verlag, [2008]
Series:	Frontiers in electronic testing ; 37.
Subjects:	Microtechnology. Nanotechnology. Electronic books.
Online Access:	Connect to the full text of this electronic book