Fault diagnosis of analog integrated circuits /

Bibliographic Details
Main Author:	Kabisatpathy, Prithviraj
Corporate Author:	SpringerLink (Online service)
Other Authors:	Barua, Alok, Sinha, Satyabroto
Format:	eBook
Language:	English
Published:	Dordrecht : Springer, [2005]
Series:	Frontiers in electronic testing ; 30.
Subjects:	Linear integrated circuits > Testing. Linear integrated circuits. Circuits analogiques > Défauts. Circuits analogiques > Essais. Circuits intégrés > Défauts. Circuits intégrés > Essais. Semiconducteurs > Défauts. Semiconducteurs > Essais. Electronic books.
Online Access:	Connect to the full text of this electronic book Publisher description

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