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Focused ion beams for materials characterization and micromachining : March 24-28, 2008, San Francisco, California, USA.

Bibliographic Details
Corporate Author: Materials Research Society. Fall Meeting
Format: Book
Language:English
Published: Warrendale, PA : Materials Research Society, [2008]
Series:Materials Research Society symposia proceedings ; v. 1089.
Subjects:
Focused ion beams > Industrial applications > Congresses.
Micromachining > Materials > Congresses.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QC702.7.B65 F64 2008
 
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QC702.7.B65 F64 2008 Available