Cover Image

Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings /

Show other versions (1)
Bibliographic Details
Corporate Authors: International Workshop on Structural and Syntactic Pattern Recognition Hong Kong, China, International Association for Pattern Recognition, SpringerLink (Online service), International Workshop on Statistical Techniques in Pattern Recognition
Other Authors: Yeung, Dit-Yan, 1960-
Format: Conference Proceeding eBook
Language:English
Published: Berlin ; New York : Springer, [2006]
Series:Lecture notes in computer science. 4109.
Subjects:
Pattern recognition systems > Congresses.
Reconnaissance des formes (Informatique) > Congrès.
Electronic books.
Online Access:Connect to the full text of this electronic book
Publisher description

Internet

Connect to the full text of this electronic book
Publisher description

Available Online

Holdings details from Available Online
Call Number: TK7882.P3 I57 2006eb
 
Call Number Status Get It
TK7882.P3 I57 2006eb Available