Applied scanning probe methods IX : characterization /
| Corporate Author: | |
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| Other Authors: | , , |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[2008]
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| Series: | Nanoscience and technology.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Item Description: | Electronic resource. |
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| Physical Description: | lix, 387 pages : illustrations (some color) ; 25 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 354074083X 9783540740834 |
| ISSN: | 1434-4904 |
| DOI: | 10.1007/978-3-540-74083-4 |