Applied scanning probe methods IX : characterization /
| Corporate Author: | |
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| Other Authors: | , , |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[2008]
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| Series: | Nanoscience and technology.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Internet
Connect to the full text of this electronic bookAvailable Online
| Call Number: |
TA417.23 .A655 2008beb |
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|---|---|---|
| Call Number | Status | Get It |
| TA417.23 .A655 2008beb | Available | |